Utility model patent: Energy saving refrigeration system ZL202221162918.2 for cold and hot shock test chamber
Software Copyright: Energy saving Temperature Thermal Shock Test Measurement and Control System (Software Patent No. 0922788)
CE Safety Certification Number: AT58250SC01000086
1.Device introduction:
This device is a large two chamber displacement switching temperature zone thermal shock test chamber specially designed for large volume and heavy samples such as large lithium batteries, automotive engines, transmissions, new energy motors and controllers, LCD TVs, servers, etc; The thermal shock test chamber is used to test the tolerance and reliability of various raw materials or finished products under the climate environment of instantaneous transition between extreme high temperature and extreme low temperature, and evaluate their physical, chemical, and electrical properties.
2. Device features:
2.1. The equipment production and testing are strictly carried out in accordance with national standards, with key core parameters such as temperature deviation, fluctuation, uniformity, test chamber air reset time, and sample surface reset time meeting the relevant requirements of GB2423 (IEC60068), which can completely replace similar products in Europe, America, and Japan.
2.2. More than 2400 hours of single fault free continuous operation; The operating life of the machine is more than 100000 hours, the safety performance has passed the EU CE safety inspection certification.
3. Device specification:
Model No. |
TS-II-1120A/B |
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Internal volume |
1120L |
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Internal dimension |
W140×D80×H100cm |
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External dimension |
W392×D231×H266cm |
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Weight(Kg) |
1200/1400 |
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Device structure |
Drive the sample basket automatically between the cold and hot zones through a cylinder to complete the shock test. |
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Shock test mode |
Low temperature → high temperature→ low temperature or high temperature→ low temperature →high temperature; so reciprocating cycle |
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Performance parameter |
Temp. range |
Temperature shock range |
A type(-40~180°C)(-60℃~180℃) |
B type(-65~200°C) |
High temperature storage range |
60℃~200℃ |
60℃~220℃ |
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Low temperature storage range |
-60℃~-10℃ |
-75℃~-10℃ |
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Shift time |
≤10S |
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Recovery time |
≤3Min |
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Sample surface recovery time |
≤6Min(Subject to IC surface) |
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Temperature uniformity |
≤2.0℃ |
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Temperature deviation |
≦±2.0℃ |
Mechanical environmental testing